Abstract: In conventional weapon test field, the parameter of projectile explosion position is an important index to measure the control ability and damage efficiency of fuze. Due to the random ...
Abstract: High static power associated with static random access memory (SRAM) represents a bottleneck in increasing the amount of on-chip memory. Novel, emerging nonvolatile memories such as ...
Key Laboratory of Advanced Materials (MOE) and School of Materials Science and Engineering, Tsinghua University, Beijing 100084, P. R. China Department of Physics and Astronomy, University of Georgia, ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback